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PELCO X-CHECKER™ Wafer Conductive is stable under the electron

SKU: 81014307662

4.4
USD1364.70 USD1386.70

Pay in 4 interest-free payments of $341.18 Learn more

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Ships within 48 hours · Estimated delivery Aug 4 - Aug 9

Description

is stable under the electron beam and is less hydrophobic than carbon

5 Tip Radius (Nom): 8 Tip Radius (Max): 12 Tip Set Back (Nom): 15 Tip Set Back( RNG): 5 - 25

3 BAR PATTERNS from

package of 100 grids

EasyGrip™ Edge

PELCO X-CHECKER™ Wafer Conductive is stable under the electronDESCRIPTION The PELCO X Checker Wafer is available for systems set up for silicon wafer handling. The PELCO X Checker Wafer is available on standard 200mm (8") and 300mm (12") wafers, with eight standards for elemental and spatial calibrations. The #602 20 and #602 21 contain: Copper disc to check spectral calibration Manganese 88%, nickel 12% alloy to measure full width at half max (FWHM) detector resolution Nickel 400 mesh TEM grid for imaging

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
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